The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Aug. 20, 2021
Applicant:

V Technology Co., Ltd., Kanagawa, JP;

Inventor:

Yoshiyuki Enomoto, Kanagawa, JP;

Assignee:

V TECHNOLOGY CO., LTD., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70358 (2013.01); G03F 7/70091 (2013.01); G03F 7/7015 (2013.01); G03F 7/70258 (2013.01); G03F 7/70425 (2013.01);
Abstract

A projection exposure apparatus includes a mask mark illumination light source irradiating a mask mark with exposure light itself or a first alignment light having substantially the same wavelength as the exposure light, and an alignment unit having a work mark illumination light source irradiating a work mark with second alignment light having a wavelength different from the wavelength of the exposure light, an imaging device, and an imaging optical system. The imaging optical system includes a first dichroic prism for synthesizing the first alignment light and the light from the work mark and emitting the synthesized light toward the imaging device, and an optical path length changing optical system for splitting and merging the first alignment light, in which the optical positional relationships of the work mark and the image of the mask mark with respect to the imaging device are equivalent.


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