The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Aug. 30, 2021
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventor:

Rongguang Liang, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/04 (2006.01); G02B 13/14 (2006.01); G02B 17/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/04 (2013.01); G02B 13/146 (2013.01); G02B 17/0832 (2013.01);
Abstract

Devices, systems and methods related to all-reflective microscopes are described. The microscopes include an all-reflective off-axis optical system and is characterized with substantially zero chromatic aberration, low group delay dispersion and no central obscuration. One reflective microscope configuration includes a reflective objective subsection with at least three mirrors, where at least one mirror is off-axis and non-spherical. The reflective microscope also includes a reflective relay subsection with at least two minors having freeform surfaces and positioned to receive light from the reflective objective subsection. The reflective relay subsystem is configured to produce a magnification to allow coupling of light between two planes having differing beam sizes. The reflective microscope further includes an imaging subsection with at least one mirror having a freeform surface and positioned to receive light from the reflective relay subsection and to direct light received thereon in reflection in a direction of a sensor.


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