The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Mar. 17, 2022
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventor:

Satoshi Yamamoto, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); H04N 23/10 (2023.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/008 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); H04N 23/10 (2023.01); H04N 23/56 (2023.01);
Abstract

A sample observation device includes an irradiation optical system that emits planar light and having different wavelengths so as to pass through cross sections at different positions of the sample, a scanning unit that scans the sample with respect to the irradiation surfaces and, an imaging optical system that has an observation axis inclined with respect to the irradiation surfaces and images each of light images of observation light, an image acquiring unit that acquires each of first image data and second image data during scanning of the sample by the scanning unit, and an image generating unit that generates observation image data and the sample on the basis of the first image data and the second image data.


Find Patent Forward Citations

Yamamoto, Satoshi. (2025). Sample observation device and sample observation method with planar light having different wavelengths (U.S. Patent No. 12481140). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12481140

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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