The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Mar. 28, 2023
Applicant:
Tdk Corporation, Tokyo, JP;
Inventors:
Kenji Nagase, Hong Kong, CN;
Hiroshi Take, Hong Kong, CN;
Anthony Reymund Melad Binarao, Hong Kong, CN;
Cheng Bu Heng, Hong Kong, CN;
Assignee:
TDK CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01); G02B 6/125 (2006.01);
U.S. Cl.
CPC ...
G02B 6/125 (2013.01); G02B 2006/1204 (2013.01); G02B 2006/12097 (2013.01);
Abstract
An optical device and an optical modulator, the optical device includes an optical waveguide, at an surface of plate-like or film-like electro-optic material forming the optical waveguide, 3 locations are selected in the extension direction of the optical waveguide, and 2 locations are selected in the width direction of the optical waveguide in a range of a region of 0.1×0.1 μm, and for a total of 6 locations, an surface roughness RMS is measured with Atomic Force Microscope, and an average of the RMS is 5.1 nm or less.