The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Aug. 21, 2020
Innoviz Technologies Ltd., Rosh Ha'Ayin, IL;
Omer David Keilaf, Kfar Saba, IL;
Oren Buskila, Hod Hasharon, IL;
Ronen Eshel, Givataim, IL;
Yair Antman, New York, NY (US);
Amit Steinberg, Adanim, IL;
David Elooz, Kfar Ha'Ro'E, IL;
Julian Vlaiko, Kfar Saba, IL;
Innoviz Technologies Ltd., Rosh Ha'Ayin, IL;
Abstract
Systems and methods use LIDAR technology. In one implementation, a LIDAR system includes at least one processor configured to: control activation of at least one light source for illuminating a field of view; receive from at least one sensor having a plurality of detection elements reflections signals indicative of light reflected from objects in the field of view; dynamically allocate a first subset of the plurality of detection elements to constitute a first pixel; dynamically allocate a second subset of the plurality of detection elements to constitute a second pixel; following processing of the first pixel and the second pixel, dynamically allocate a third subset of the plurality of detection elements to constitute a third pixel, the third subset overlapping with at least one of the first subset and the second subset, and differing from each of the first subset and the second subset; and following processing of the first pixel and the second pixel, dynamically allocate a fourth subset of the plurality of detection elements to constitute a fourth pixel, the fourth subset overlapping with at least one of the first subset, the second subset, and the third subset, and differing from each of the first subset, the second subset, and the third subset.