The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Jan. 04, 2024
Applicant:

Raysecur, Inc., Westwood, MA (US);

Inventors:

Linda Marchese, Québec, CA;

Marc Terroux, Québec, CA;

Alexander Georg Sappok, Newton, MA (US);

Charles Mcalister Marshall, North Andover, MA (US);

Assignee:

RaySecur, Inc., Westwood, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01N 21/90 (2013.01); G01N 2201/10 (2013.01); G01N 2201/127 (2013.01);
Abstract

There is provided object scanning apparatus and methods of scanning objects. The object scanning apparatus may include a THz source emitting an optical beam; an electromagnetic energy source for generating a radiation signal at a wavelength other than terahertz, such as RF or MMW radiation; an optical system for directing the optical beam; a zone for inspecting objects wherein the optical beam and radiation signal interact with the object; a motion device for changing the spatial or temporal interaction of the object and optical beam and the radiation signal; at least one transducer, the at least one transducer including an imaging transducer for converting the optical beam energy and radiation signal after interaction with the object to an electronic image; and a processor for performing processing of the image for use in characterization of the object or its interior contents or composition.


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