The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Dec. 18, 2023
Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Abstract
A measuring device for measuring a measurand of a medium includes a measuring cell, a measuring cell receptacle for holding the measuring cell, and a measuring apparatus for measuring the measurand, wherein the measuring cell includes a measurement chamber containing the medium and a reference chamber separate from the measurement chamber and containing a reference medium. The measurement chamber and the reference chamber are arranged relative to one another such that the measuring cell can be inserted into the measuring cell receptacle in a measuring position, in which measurements of the measurand of the medium can be performed by means of the measuring apparatus, and can be inserted into the measuring cell receptacle in a reference position, in which reference measurements of a reference variable of the reference medium in the reference chamber can be performed by means of the measuring apparatus.