The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Sep. 05, 2023
Applicant:
Arkray, Inc., Kyoto, JP;
Inventors:
Seiji Satake, Kyoto, JP;
Maiho Kitajima, Kyoto, JP;
Assignee:
ARKRAY, Inc., Kyoto, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); G01N 21/84 (2006.01); G01N 33/493 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/78 (2013.01); G01N 21/8483 (2013.01); G01N 33/493 (2013.01); G01N 35/00029 (2013.01); G01N 2035/00108 (2013.01); G01N 35/00613 (2013.01);
Abstract
An analysis device includes a measurement unit that measures a color state of a test strip under a defined condition, an imaging unit that captures an image of the color state of the test strip, an analysis unit that analyzes the color state from the captured image obtained by imaging by the imaging unit, and a switching unit that selectively switches between a first mode in which the measurement unit measures the color state and a second mode in which the analysis unit analyzes the color state from the captured image.