The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Aug. 30, 2021
Endress+hauser Se+co. KG, Maulburg, DE;
Mohammad Sadegh Ebrahimi, Lörrach, DE;
Gerd Bechtel, Steinen, DE;
Raphael Kuhnen, Schliengen, DE;
Tobias Brengartner, Emmendingen, DE;
Dietmar Frühauf, Lörrach, DE;
Anh Tuan Tham, Berlin, DE;
Endress+Hauser SE+Co. KG, Maulburg, DE;
Abstract
A sensor apparatus for determining and/or monitoring a process variable of a medium in a containment includes: a crystal body including at least one defect; a magnetic field system for producing a magnetic field in the region of the crystal body and in the region of the medium within the containment, wherein the crystal body and the magnetic field system are arrangeable from the outside at a wall of the containment; a detection unit for detecting a magnetic field-dependent, fluorescent signal from the crystal body, wherein the detection unit has an excitation unit for optical exciting of the defect and a detector for detecting the fluorescent signal; and an evaluation unit for ascertaining at least one piece of information concerning the process variable based on the fluorescent signal.