The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Mar. 29, 2022
National University Corporation Nagaoka University of Technology, Niigata, JP;
Opt Gate Co., Ltd., Tokyo, JP;
Moritsugu Sakamoto, Niigata, JP;
Hiroshi Ono, Niigata, JP;
Kohei Noda, Niigata, JP;
Masayuki Tanaka, Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION NAGAOKA UNIVERSITY OF TECHNOLOGY, Nagaoka, JP;
OPT GATE CO., LTD., Tokyo, JP;
Abstract
Provided is an optical measurement apparatus including: a polarized light irradiation unitthat irradiates a subject Ob with irradiation light of which polarization is controlled; and a polarization imaging unitthat images a polarization state of measurement light occurring due to scattering or the like of the irradiation light by the subject Ob, calculates Stokes parameters of the measurement light, and measures a variation of a polarized component occurring between the irradiation light and the measurement light. Since the subject is irradiated with irradiation light of which a polarization state is controlled, it is possible to acquire subject information that is difficult to measure in a case of irradiating the subject with natural light, and it is also possible to suppress noise or the like that occurs when measuring polarization by irradiating the subject with irradiation light of which a polarization state is unstable.