The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Nov. 04, 2020
Applicant:

Ashigara Manufacturing Inc., Kanagawa, JP;

Inventors:

Terumitsu Ishii, Kanagawa, JP;

Daisuke Yamamoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); G01N 21/35 (2014.01); G01N 31/16 (2006.01); G01N 31/22 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01N 21/35 (2013.01); G01N 31/168 (2013.01); G01N 31/221 (2013.01); G01N 31/222 (2013.01); G01N 31/223 (2013.01); C08J 2301/12 (2013.01); G01N 2021/3595 (2013.01); G01N 33/0096 (2024.05); G01N 2203/0282 (2013.01);
Abstract

An object of the present invention is to provide a novel method for diagnosing film degradation which can identify the degraded state of a film based on a resin more efficiently and reliably than ever. In order to attain this object, a method for diagnosing the degradation of a film based on a resin is adopted, the method comprising using the following analysis method A and/or analysis method B, which is a non-destructive analysis method: analysis method A: confirming the presence or absence of abnormality in the film by visual observation and olfactometry, and analysis method B: confirming the presence or absence of an acid anhydride and a sign of hydrolysis reaction as to the film by Fourier transform infrared spectroscopy analysis.


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