The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jan. 14, 2022
Sony Group Corporation, Tokyo, JP;
Hiroshi Morita, Tokyo, JP;
Yusuke Oyama, Tokyo, JP;
Kazuaki Toba, Tokyo, JP;
Masanari Yamamoto, Tokyo, JP;
SONY GROUP CORPORATION, Tokyo, JP;
Abstract
Provided is an apparatus to properly measure the bending amount of an optical waveguide routed in an electronic device or the like. An optical signal outputted with a second wavelength from the optical waveguide is received by a light receiving unit. In this case, the optical waveguide allows propagation only in a basic mode at a first wavelength and the second wavelength is a wavelength where the optical waveguide allows propagation at least in a primary mode in addition to a basic mode. The bending amount of the optical waveguide is obtained by a processing unit on the basis of the amount of a primary mode component included in the optical signal with the second wavelength.