The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Jul. 10, 2024
Applicant:

Seek Thermal, Inc., Goleta, CA (US);

Inventors:

William J. Parrish, Santa Barbara, CA (US);

Andrew Duerner, Santa Barbara, CA (US);

Brian Nehring, Santa Barbara, CA (US);

Matt Buckley, Santa Barbara, CA (US);

Charles Meyer, Santa Barbara, CA (US);

Assignee:

Seek Thermal, Inc., Goleta, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01K 15/002 (2013.01); G01K 15/005 (2013.01); H05K 1/0212 (2013.01); H05K 2201/10151 (2013.01);
Abstract

A temperature-controlled calibration source for thermal imaging that provides for extremely inexpensive, mass producible, field deployable thermal calibration in specific, relatively low temperature ranges, and in particular temperatures near nominal human body temperature. A calibration source suitable for such applications may be implemented primarily as a suitable designed Printed Circuit Board (PCB), packaged in a thermally isolating housing and powered of commonly available power sources such as USB chargers.


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