The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Feb. 22, 2024
Applicant:

Amtran Technology Co., Ltd., New Taipei, TW;

Inventors:

Hsiao I Lin, New Taipei, TW;

Chao-Ching Chen, New Taipei, TW;

Yi Hsueh Lin, New Taipei, TW;

Assignee:

AmTRAN Technology Co., Ltd., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/506 (2013.01);
Abstract

An optical measurement apparatus includes a color analyzing device and an abutting member. The color analyzing device includes a light collecting portion, a body and a connecting portion. The light collecting portion is configured to face to a device under test (DUT) and collect a light emitted from the DUT. The body is configured to measure and analyze the light. The connecting portion connects between the body and the light collecting portion along an axis. The abutting member is tubular and extends along the axis. The abutting member has a first rim and a second rim opposite to the first rim along the axis. The connecting portion penetrates through the first rim and connects with an inner wall of the abutting member. The second rim defines a first abutting surface inclined by a measurement angle relative to the axis and configured to abut against the DUT.


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