The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Dec. 22, 2022
Applicant:

Endress+hauser Group Services Ag, Reinach, CH;

Inventors:

Max Bergau, Freiburg, DE;

Tobias Meinert, Freiburg, DE;

Benjamin Scherer, Oberried, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01);
Abstract

A stereoscopic measuring device for determining position information of an event location comprises a background surface and a lighting assembly having a first lighting position and a second lighting position for the illumination of the background surface at different angles. The light beams from the lighting positions passing through an event location are projected at spaced-apart projection locations at a projection location distance. The measuring device also includes an imaging apparatus for imaging the projection locations and an evaluation apparatus for detecting an event, for determining the projection location distance and the position information of the event location based on the projection location distance. The event location is a location at which the medium to be detected appears. Its interaction with the light beams changes a property of the projection locations compared to reference conditions in which the medium to be detected is absent or effective in a different way.


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