The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Apr. 07, 2025
Applicant:

Naomi L. Nakao, New York, NY (US);

Inventor:

Naomi L. Nakao, New York, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 10/04 (2006.01); A61B 10/02 (2006.01);
U.S. Cl.
CPC ...
A61B 10/04 (2013.01); A61B 2010/0208 (2013.01); A61B 2010/045 (2013.01);
Abstract

An endoscope biopsy instrument includes a scamming sub assembly located at a proximal end of a handle and adapted to rotate an elongate needle shaft member during an axial motion of an outer handle member and the elongate needle shaft member relative to an inner handle member. Two key elements extend outwardly from a stylist member into corresponding helical guide grooves with interleaved windings in an inner surface of the inner handle member. The helical guide grooves are located within a proximal end portion of the inner handle member and extend from a proximal end of the inner handle member to a point located intermediately along the inner handle member. The helical guide grooves, of the inner handle member, are parallel and accordingly have the same screw pitch. The stylist is rotatably connected at a proximal end to a proximal end of the outer handle member and is affixed at a distal end to the needle shaft member.


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