The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Mar. 29, 2019
Agency for Science, Technology and Research, Singapore, SG;
Tan Tock Seng Hospital Pte Ltd, Singapore, SG;
Kok Soon Phua, Singapore, SG;
Hai Hong Zhang, Singapore, SG;
Su-Yin Yang, Singapore, SG;
Fong Ling Loy, Singapore, SG;
Ka Yin Christina Tang, Singapore, SG;
Soon Huat Ng, Singapore, SG;
Chuan Chu Wang, Singapore, SG;
Cuntai Guan, Singapore, SG;
Soon Yin Tjan, Singapore, SG;
AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH, Singapore, SG;
TAN TOCK SENG HOSPITAL PTE LTD, Singapore, SG;
Abstract
Disclosed is a process for identifying and extracting pain-related electroencephalogram (EEG) signals. The process comprises receiving, from one or more trials, EEG data for each trial; determining a current density for each signal; estimating the current density for a set of neural activity regions of interest, based on the computed current density; and computing at least one spectrum characteristic for each trial based on the estimated current density. Thus mean and variance of changes in the EEG data between EEG data labeled as being indicative of a pain state and EEG data labeled as being indicative of a non-pain state, for each neural activity region of interest can be calculated, and pain-related EEG signals can be identified based on at least one a region of interest at which the variance is below a predetermined threshold.