The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jun. 01, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/135 (2006.01); A61B 3/117 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/135 (2013.01); A61B 3/117 (2013.01); A61B 3/14 (2013.01);
Abstract
A slit lamp microscope of an aspect example includes a scanner, a controller, and an image set creation processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect an image group. The controller is configured to control the scanner to apply two or more scans to the anterior segment. The image set creation processor is configured to create an image set by selecting a series of images corresponding to a scan area from two or more image groups collected by the scanner in the two or more scans.