The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Jun. 03, 2022
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Takeshi Ito, Hino, JP;

Masayoshi Saito, Hachioji, JP;

Koki Morishita, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/06 (2006.01); A61B 1/00 (2006.01); A61B 1/05 (2006.01); A61B 1/273 (2006.01);
U.S. Cl.
CPC ...
A61B 1/0655 (2022.02); A61B 1/000094 (2022.02); A61B 1/05 (2013.01); A61B 1/0638 (2013.01); A61B 1/0669 (2013.01); A61B 1/2733 (2013.01);
Abstract

A light source device includes a first light source, a second light source, and a processor. The processor controls, based on spectrum setting information, an emitted light amount of the first light source and an emitted light amount of the second light source so that the emitted light amount of the first light source becomes larger than the emitted light amount of the second light source. The observation object includes a region of interest, a merkmal, and a peripheral portion. The spectrum setting information is set based on a merkmal observed ratio that is a ratio between a spectral reflectance in the merkmal and a spectral reflectance in the peripheral portion. A degree of disassociation of the merkmal observed ratio in the first wavelength region from 1 is greater than a degree of disassociation of the merkmal observed ratio in the second wavelength region from 1.


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