The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Aug. 25, 2021
Applicants:

Pavel Stok, Liberec, CZ;

Pavel Zadrazil, Turnov, CZ;

Petr Franc, Simonovice, CZ;

Martin Novotny, Liberec, CZ;

Stanislava Stará, Liberec, CZ;

Inventors:

Pavel Stok, Liberec, CZ;

Pavel Zadrazil, Turnov, CZ;

Petr Franc, Simonovice, CZ;

Martin Novotny, Liberec, CZ;

Stanislava Stará, Liberec, CZ;

Assignee:

Preciosa, a.s., Jablonec nad Nisou, CZ;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A44C 17/00 (2006.01); A44C 27/00 (2006.01); C03C 17/00 (2006.01);
U.S. Cl.
CPC ...
A44C 17/001 (2013.01); A44C 17/007 (2013.01); A44C 27/005 (2013.01); C03C 17/009 (2013.01); C03C 2217/72 (2013.01);
Abstract

A final layer of a multi-layer of thin deposit and lacquer layers of a decorative faceted functional stone formed by 10 to 35% of nano/colloidal silica, optionally nano/colloidal alumina, 30 to 50% of encapsulated aluminium flakes in grain size of 15-80 μm, 2 to 10% of Fe3O4 in grain size of 3-50 μm, and 10 to 40% of polyisocyanate-hardened mixture of epoxy and polyether resin, and a method for increasing the opacity and hardness of a multi-layer of thin deposit and lacquer layers of a decorative faceted functional stone by applying this final layer.


Find Patent Forward Citations

Stok, Pavel. (2025). Multi-layer of decorative faceted fashion jewellery stones for technical use (U.S. Patent No. 12478151). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12478151

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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