The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Nov. 03, 2022
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Ahmad Awada, Munich, DE;

Panagiotis Spapis, Munich, DE;

Umur Karabulut, Munich, DE;

Sanjay Goyal, Denville, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 76/25 (2018.01); H04W 48/16 (2009.01); H04W 48/20 (2009.01);
U.S. Cl.
CPC ...
H04W 76/25 (2018.02); H04W 48/16 (2013.01); H04W 48/20 (2013.01);
Abstract

An apparatus may be configured to: receive two or more filtering configurations, wherein a first configuration is associated with at least one first target cell associated with a first distributed unit, wherein a second configuration is associated with at least one second target cell associated with at least one second distributed unit, wherein the first distributed unit is different from the at least one second distributed unit; select a configuration of the two or more configurations for at least one target cell based, at least partially, on a determination of whether a serving cell and the at least one target cell are controlled with a same distributed unit, wherein the serving cell is controlled with the first distributed unit; and perform filtering of a plurality of layer one measurements associated with the at least one target cell using the selected configuration.


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