The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Mar. 02, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Jingchao Bao, San Diego, CA (US);

Sony Akkarakaran, Poway, CA (US);

Tao Luo, San Diego, CA (US);

Juan Montojo, San Diego, CA (US);

Alexandros Manolakos, Escondido, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04L 5/00 (2006.01); H04W 24/10 (2009.01); H04W 92/18 (2009.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); H04L 5/0051 (2013.01); H04W 24/10 (2013.01); H04W 92/18 (2013.01);
Abstract

A method of cross validating a positioning reference signal includes: measuring, at a first UE, a first PRS resource to determine a first PRS measurement; receiving, from a second UE via sidelink communication, a second PRS measurement of a second PRS resource; and determining whether at least one of the first PRS measurement or the second PRS measurement is unreliable based on a relationship of the first PRS measurement to the second PRS measurement.


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Bao, Jingchao. (2025). Prs measurement cross validation (U.S. Patent No. 12477503). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12477503

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