The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jun. 08, 2023
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Oana-Elena Barbu, Aalborg, DK;

Diomidis Michalopoulos, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 56/00 (2009.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 56/0015 (2013.01); H04B 17/328 (2023.05);
Abstract

This specification describes an apparatus comprising: means for receiving, at a target user equipment, UE, a signal including information indicative of supporting UE measurements of signals transmitted from the target UE to a supporting UE via a multipath communications channel, the supporting UE measurements including delay and angle measurements of the signals transmitted from the target UE to the supporting UE via the multipath communications channel; means for time-aligning the supporting UE measurements with target UE measurements of signals transmitted from the supporting UE to the target UE via the multipath communications channel, the target UE measurements including delay and angle measurements for the signals transmitted from the supporting UE to the target UE via the multipath communications channel; means for determining, based on the time-aligned measurements, an association between a component of the target UE measurements and at least one respective component of the supporting UE measurements, wherein the associated components are determined to correspond to a particular reflector in an environment of the target UE; and means for determining, based on the associated components, location information for the particular reflector.


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