The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jun. 22, 2021
Samsung Electronics Co., Ltd., Suwon-si, KR;
Jinyoung Oh, Suwon-si, KR;
Hoondong Noh, Suwon-si, KR;
Younsun Kim, Suwon-si, KR;
Taehyoung Kim, Suwon-si, KR;
Hyoungju Ji, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Disclosed are a method and a device for controlling the measuring and reporting of adjacent channel interference in a wireless communication system. The method comprises the steps of: transmitting, to a base station, a terminal capability report related to the measurement and report of sub-band-specific adjacent channel leakage (ACL) interference; receiving, from the base station, setting information that indicates a frequency resource and a time resource for the measuring and reporting of sub-band-specific ACL interference; measuring sub-band-specific ACL interference on the basis of the setting information; and reporting, to the base station, the measured sub-band-specific ACL interference.