The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Nov. 21, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Ahmed Farhan Hanif, Versailles, FR;

Jelena Damnjanovic, Del Mar, CA (US);

Sony Akkarakaran, Poway, CA (US);

Tao Luo, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/04 (2009.01); H04B 7/06 (2006.01); H04L 41/0668 (2022.01); H04W 24/04 (2009.01); H04W 24/08 (2009.01); H04B 17/318 (2015.01); H04W 92/18 (2009.01);
U.S. Cl.
CPC ...
H04W 24/04 (2013.01); H04B 7/06964 (2023.05); H04L 41/0668 (2013.01); H04W 24/08 (2013.01); H04B 17/318 (2015.01); H04W 92/18 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. A user equipment (UE) may transmit a first set of reference signals via a primary sidelink carrier of a sidelink carrier aggregation configuration and a second set of reference signals via one or more secondary sidelink carriers of the sidelink carrier aggregation configuration. The UE may receive, based on the reference signals, a measurement message indicating measurements for a set of beams corresponding to a secondary sidelink carrier of the sidelink carrier aggregation configuration based on a beam failure instance for the primary sidelink carrier. The UE may transmit, via Layer 1 signaling or Layer 2 signaling, a control message indicating to switch the primary sidelink carrier to the set of beams based on the measurements for the set of beams and the beam failure instance for the primary sidelink carrier.


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