The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Nov. 01, 2022
Applicant:

Enscape Co., Ltd., Seongnam-si, KR;

Inventors:

Nam Dong Kim, Suwon-si, KR;

Sang Sik Min, Hwaseong-si, KR;

Won Young Jeong, Suwon-si, KR;

Jae Hyuk Choi, Gimpo-si, KR;

Jin Hyeok Ko, Seoul, KR;

Yong Deong Kang, Seongnam-si, KR;

Sang Baek Kim, Seongnam-si, KR;

Assignee:

ENSCAPE CO., LTD., Seongnam-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/58 (2023.01); H04N 5/265 (2006.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
H04N 23/58 (2023.01); H04N 5/265 (2013.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01);
Abstract

The appearance inspection apparatus for a secondary battery according to the disclosure can obtain an image corresponding to an area of not less than 180 degrees of a lateral surface of the secondary battery when the secondary battery is captured at a first posture, and obtain an image corresponding to the entire lateral surface of the secondary battery when the secondary battery is captured at a second posture, thereby having an effect on significantly improving inspection speed.


Find Patent Forward Citations

Kim, Nam. (2025). Apparatus for inspecting appearance of secondary battery (U.S. Patent No. 12477207). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12477207

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…