The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jun. 24, 2021
Applicant:

Kowa Company, Ltd., Nagoya, JP;

Inventors:

Katsumi Yabusaki, Tokyo, JP;

Takao Shinohara, Tokyo, JP;

Assignee:

Kowa Company, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/262 (2006.01); G06T 7/20 (2017.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
H04N 5/2624 (2013.01); G06T 7/20 (2013.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20212 (2013.01);
Abstract

An example apparatus comprising an image acquisition unit configured to acquire a plurality of images having temporal or spatial continuity; a channel assignment unit configured to assign a channel different from each other to at least a part of gradation information on a color and/or gradation information on brightness that can be acquired from each image of the plurality of images based on a predetermined rule; a composite image generation unit configured to generate one composite image in which gradation information on at least a part of each image can be identified by the channel by extracting and combining gradation information to which the channel is assigned from each of the plurality of images; and an inference unit configured to analyze the composite image and to infer the plurality of images.


Find Patent Forward Citations

Yabusaki, Katsumi. (2025). Image analysis method, learning image or analysis image generation method, learned model generation method, image analysis apparatus, and image analysis program (U.S. Patent No. 12477074). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12477074

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