The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Oct. 12, 2021
Applicant:

Esko Software Bv, Ghent, BE;

Inventors:

Dries Vandenbussche, Ghent, BE;

Rian Goossens, Ghent, BE;

Barry Ben Ezra, Ghent, BE;

Jeroen Penninck, Ghent, BE;

Assignee:

ESKO SOFTWARE BV, Ghent, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/58 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00023 (2013.01); H04N 1/00034 (2013.01); H04N 1/00074 (2013.01); H04N 1/00087 (2013.01); H04N 1/0009 (2013.01); H04N 1/58 (2013.01); H04N 1/6033 (2013.01); H04N 1/6097 (2013.01);
Abstract

A method for controlling production of color products includes receiving a reference image for a color product; producing a plurality of color products corresponding to the color product in the reference image; acquiring a plurality of images corresponding to the plurality of color products; determining whether an appearance defect exists for each of the plurality of color products by comparing each image of the plurality of images corresponding to the plurality of color products to the reference image; for each detected appearance defect, determining a severity of the appearance defect; generating a visualization of appearance defects on an image of the color product based on the severity of the appearance defect and a frequency of occurrence of the appearance defect; and adjusting production of the color product in response to the visualization of appearance defects to reduce the severity or frequency of occurrence of the appearance defect.


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Vandenbussche, Dries. (2025). System and method for visualization of variances observed on substrate surfaces (U.S. Patent No. 12477071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12477071

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