The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jun. 07, 2024
Xi'an Jiaotong University, Xi'an, CN;
Zipeng Liu, Xi'an, CN;
Jinjun Liu, Xi'an, CN;
XI'AN JIAOTONG UNIVERSITY, Xi'an, CN;
Abstract
The present disclosure discloses a two-point sampling optimized method and system for sinusoidal excitation-based frequency response measurement. A plurality of points are sampled at equal intervals within the starting frequency and ending frequency range as initial information, the interpolation error of each sub-frequency band is estimated according to existing sampling information, the sub-frequency band with the largest interpolation error is selected, two new sampling points are added within the sub-frequency band, and the above steps are repeated until the quantity of sampling points reaches the total quantity set by a user; and the user is asked whether new sampling points need to be added, if so, after the user specifies a new quantity of sampling points, the interpolation error of each sub-frequency band is estimated again and sampling continues, otherwise, the sampling ends. The present improves the practicality of a sinusoidal excitation-based frequency response measurement method.