The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Feb. 03, 2023
Celona, Inc., Campbell, CA (US);
Srinivasan Balasubramanian, San Diego, CA (US);
Sushanth Chandappa Kulal, Campbell, CA (US);
CELONA, INC., Campbell, CA (US);
Abstract
A probe device and method for measuring TDD interference from neighboring networks in an Enterprise Network (EN). The probe device is situated on a campus of an EN in a position for measuring TDD interference between a neighboring wireless network. The probe device measures TDD interference data and provides it to an Enterprise Network and Orchestrator, which determines the TDD configuration used by neighboring networks, and can take action to mitigate or resolve interference effects from neighboring networks. The probe UE has a TDD measurement unit that may include an SIB Measurement unit for receiving broadcast SIBs signals from neighboring networks, a UL SINR Measurement Unit, a DL SINR Measurement Unit, and a UL RSSI Measurement Unit. The probe device may be positioned in a fixed location in an Enterprise Network campus, and connected to an external power supply.