The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Oct. 28, 2022
Method and analysis system for analyzing test capabilities of a mobile communication test instrument
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Manuel Galozy, Munich, DE;
Jesper Sandvad, Munich, DE;
Kristian Soerensen, Munich, DE;
Samuele Tortelli, Munich, DE;
Anders Poulsen, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method of analyzing test capabilities of a mobile communication test instrument is described. The method includes the steps of: receiving device under test (DUT) parameters being associated with a device under test, wherein the DUT parameters comprise information on a subset of band configurations associated with a device under test, wherein the subset of band configurations is to be tested; receiving, from an instrument database, test instrument parameters being associated with the test instrument, wherein the test instrument parameters comprise information on features of the test instrument; and determining, by an analysis circuit, whether the test instrument is suitable for testing the device under test based on the DUT parameters and based on the test instrument parameters. Further, a computer program product embodied on a non-transitory computer-readable medium and an analysis system for analyzing test capabilities of a mobile communication test instrument are described.