The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

May. 18, 2022
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Syunsuke Arai, Kariya, JP;

Masayoshi Nishihata, Kariya, JP;

Shinji Hiramitsu, Kariya, JP;

Noriyuki Kakimoto, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/495 (2006.01); H01L 23/00 (2006.01); H01L 25/07 (2006.01); H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49568 (2013.01); H01L 24/32 (2013.01); H01L 24/48 (2013.01); H01L 25/072 (2013.01); H01L 23/49562 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/48245 (2013.01); H01L 2924/13055 (2013.01); H01L 2924/182 (2013.01); H01L 2924/186 (2013.01); H01L 2924/30101 (2013.01); H01L 2924/30107 (2013.01); H05K 7/209 (2013.01); H05K 7/20936 (2013.01);
Abstract

A semiconductor device has a joint part in which a first conducting part and a second conducting part are joined by a joint material. The first conducting part has a high wettability region and a low wettability region in a surface opposite to the second conducting part. The low wettability region is adjacent to the high wettability region to define an outer periphery of the high wettability region and has wettability lower than the high wettability region to the joint material. The high wettability region has an overlap region overlapping a formation region of the joint part in the second conducting part in a planar view, and a non-overlap region connected to the overlap region and not overlapping the formation region of the joint part in the second conducting part. The non-overlap region includes a holding region capable of holding the joint material that is surplus for the joint part.


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