The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Apr. 24, 2020
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Yohei Toji, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/167 (2013.01);
Abstract

An ion analyzerincluding: a first memberfixed to an ion outflow port and provided with a fixing pinon one side and a pin holeon the other side sandwiching the ion outflow port; a second memberto be fixed to the first member and including an ion flow controllerconfigured to control movement of ions flowing out from the ion outflow port, the second member having a first concave partconfigured to engage with the fixing pin from a first direction perpendicular to an axis of the fixing pin, and a second concave partconfigured to engage with an insertion pin to be inserted into the pin hole from a second direction different from the first direction; and a pin memberhaving an insertion pininserted into the pin hole and a head partconfigured to sandwich and fix the second concave part with the first member.


Find Patent Forward Citations

Toji, Yohei. (2025). Ion analyzer (U.S. Patent No. 12476099). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12476099

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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