The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

May. 21, 2021
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

David M. Cox, Toronto, CA;

Chang Liu, Richmond Hill, CA;

Stephen A. Tate, Barrie, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0454 (2013.01); H01J 49/0009 (2013.01); H01J 49/0027 (2013.01); H01J 49/0404 (2013.01);
Abstract

An ADE device identifies an identifiable sequence of one or more ejections from at least one sample using a different value or pattern of values for one or more ADE parameters. The identifiable one or more ejections are performed to produce one or more mass peaks that have a different feature value or pattern of feature values for one or more peak features than other mass peaks produced. Ejection times are stored. One or more detected peaks with the different feature values or pattern of feature values are identified as produced by the identifiable one or more ejections. A delay time is calculated from the time of the identifiable ejections and the time of the identified detected peaks and the peaks are aligned with samples using delay time, stored times, and order of the samples.


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