The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jan. 25, 2019
Applicant:
Bayer Aktiengesellschaft, Leverkusen, DE;
Inventors:
Arwa Al Dilaimi-Wendler, Leverkusen, DE;
Carsten Beyer, Hilden, DE;
Roland Beffa, Liederbach, DE;
Benjamin Buer, Cologne, DE;
Jochen Kleemann, Kerpen, DE;
Ralf Nauen, Langenfeld, DE;
Herve Tossens, Verlaine, BE;
Assignee:
Bayer Aktiengesellschaft, Leverkusen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/6869 (2018.01); A01M 1/02 (2006.01); G06Q 50/02 (2024.01); G09B 29/00 (2006.01); G16B 20/00 (2019.01); G16B 30/00 (2019.01); G16B 40/00 (2019.01);
U.S. Cl.
CPC ...
G09B 29/006 (2013.01); A01M 1/026 (2013.01); C12Q 1/6869 (2013.01); G06Q 50/02 (2013.01); G16B 20/00 (2019.02); G16B 30/00 (2019.02); G16B 40/00 (2019.02);
Abstract
A method and a system for the detection and acquisition of resistances of harmful organisms to pest control agents. The system is configured to establish a resistance map, in which information regarding the resistance of one or more harmful organisms to one or more control agents is recorded for a field or a plurality of fields for the cultivation of cultivated plants.