The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Feb. 28, 2023
Applicant:

Leica Biosystems Imaging, Inc., Vista, CA (US);

Inventors:

Ji Wang, Plainsboro, NJ (US);

Chad Salinas, Rancho Santa Fe, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01); G06T 7/12 (2017.01); G06V 10/771 (2022.01);
U.S. Cl.
CPC ...
G06V 10/771 (2022.01); G06T 3/40 (2013.01); G06T 7/0012 (2013.01); G06T 7/12 (2017.01); G06V 10/764 (2022.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An apparatus and methods for determining features in an image of a Hematoxylin and Eosin (H&E) stained tissue sample. An apparatus can be configured to apply a machine learning model to the H&E stained tissue sample image to determine features in the image. Applying the machine learning model can include performing convolution operations on the H&E stained tissue sample image to generate a plurality of initial feature maps, applying octave-convolution-first-layer operations on the initial feature maps to generate initial high-frequency feature maps and low-frequency feature maps, applying octave-convolution operations on the high-frequency initial feature maps to generate refined high-frequency feature maps, applying octave-convolution operations on the low-frequency initial feature maps to generate refined low-frequency feature maps, and applying octave-convolution last layer operations on the refined high-frequency feature maps and the refined low-frequency feature maps to produce combined feature maps.


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