The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Oct. 01, 2021
Applicant:

Fuji Corporation, Chiryu, JP;

Inventor:

Takafumi Mitsuya, Nishio, JP;

Assignee:

FUJI CORPORATION, Chiryu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G05B 19/406 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G05B 19/406 (2013.01); G05B 2219/32119 (2013.01);
Abstract

An analysis support device includes a display; a first display control section configured to display a first screen including a device scheduled image and a device actual result image on the display when a device actual result time at which a mounting device actually performs a mounting step of mounting a component on a substrate is delayed; and a second display control section configured to display a second screen including a preparation scheduled image and a preparation actual result image on the display when a predetermined first instruction is given by a user after the first screen is displayed on the display, the preparation scheduled image indicating a preparation scheduled time at which a preparation step, which is preparation for the mounting step, is to be performed, and the preparation actual result image indicating a preparation actual result time at which the preparation step is actually performed.


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