The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Feb. 28, 2022
The Regents of the University of California, Oakland, CA (US);
Canon Medical Systems Corporation, Tochigi, JP;
Jinyi Qi, Oakland, CA (US);
Tiantian Li, Oakland, CA (US);
Zhaoheng Xie, Oakland, CA (US);
Wenyuan Qi, Vernon Hills, IL (US);
Li Yang, Vernon Hills, IL (US);
Chung Chan, Vernon Hills, IL (US);
Evren Asma, Vernon Hills, IL (US);
The Regents of the University of California, Oakland, CA (US);
CANON MEDICAL SYSTEMS CORPORATION, Tochigi, JP;
Abstract
A method, system, and computer readable medium to perform nuclear medicine scatter correction estimation, sinogram estimation and image reconstruction from emission and attenuation correction data using deep convolutional neural networks. In one embodiment, a Deep Convolutional Neural network (DCNN) is used, although multiple neural networks can be used (e.g., for angle-specific processing). In one embodiment, a scatter sinogram is directly estimated using a DCNN from emission and attenuation correction data. In another embodiment a DCNN is used to estimate a scatter-corrected image and then the scatter sinogram is computed by a forward projection.