The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Oct. 24, 2022
Nanjing University of Aeronautics and Astronautics, Nanjing, CN;
Nanjing University of Aeronautics and Astronautics, Nanjing, CN;
Abstract
The present disclosure provides a method for analyzing a minor defect based on a progressive segmentation network, including: acquiring an original image for a surface of a component, and cropping the original image into a plurality of patches; inputting each of the patches to a minor defect feature extraction network to extract an image feature; classifying the patch into a defective image or a non-defective background image according to an extracted image feature; inputting an extracted image feature of the defective image to a defect segmentation network to obtain a segmentation mask image of a corresponding defect; and quantitatively analyzing the defect according to the segmentation mask image to obtain information such as an area, a length and a width of the defect.