The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Oct. 08, 2021
Dynatrace Llc, Waltham, MA (US);
Philipp Lengauer, Steyregg, AT;
Dynatrace LLC, Boston, MA (US);
Abstract
A technology is disclosed for estimating the impact that heap memory allocations have on the behavior of garbage collection activities. A sampling mechanism randomly and unbiased selects a subset of allocations for detailed analysis. A detailed analysis is performed for the selected allocation activities. Allocation monitoring data, including type and size of the allocated object and data describing the code location on which the allocation was performed are gathered. Further, the point in time, when the allocated object is later reclaimed by garbage collection is recorded. Gathered object allocation and reclaim data are used to estimate for individual allocation sites or types of allocated objects, the number of bytes that are allocated, and the number of bytes that survived a garbage collection run. Allocation activity causing frequently garbage collection runs is identified using allocation size data and the survived byte counts are used to identify allocation activity causing long garbage collection runs. Further allocation monitoring data is correlated with transaction trace data to identify the impact of transactions or transaction classes on garbage collection behavior.