The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Nov. 01, 2023
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Iouri Oboukhov, Rochester, MN (US);

Richard Galbraith, Rochester, MN (US);

Niranjay Ravindran, Rochester, MN (US);

Jonas Goode, Lake Forest, CA (US);

Weldon M. Hanson, Rochester, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 16/27 (2019.01); G16B 50/50 (2019.01); H03M 13/11 (2006.01); G11C 13/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 16/27 (2019.01); G16B 50/50 (2019.02); H03M 13/1105 (2013.01); H03M 13/1148 (2013.01); G11C 13/02 (2013.01);
Abstract

Example systems and methods for using synchronization marks to correct insertions and deletions for DNA data storage are described. A data unit may be encoded in oligos that include synchronization marks at predetermined intervals along the length of each oligo. During decoding, the synchronization marks may improve identification and isolation of insertions and deletions for correction of symbol alignment prior to error correction code decoding. In some configurations, correlation analysis may be used to improve isolation of insertions and deletions where multiple copies of the same oligo are available.


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