The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Feb. 23, 2021
Inscoper, Cesson-Sevigne, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Universite DE Rennes 1, Rennes, FR;
Maël Balluet, Pace, FR;
Jacques Pecreaux, Mordelles, FR;
Otmane Bouchareb, Cesson-Sevigne, FR;
Marc Tramier, Rennes, FR;
Baptiste Giroux, Rennes, FR;
Jérémy Pont, La Chapelle des Fougeretz, FR;
Olivier Chanteux, Cesson-Sevigne, FR;
INSCOPER, Cesson-Sevigne, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
UNIVERSITE DE RENNES, Rennes, FR;
Abstract
A technique and device for managing blocks of commands intended for a microscopy imaging device configured to acquire images of a sample. Each block of commands includes driving commands serving to drive a plurality of functional modules of the imaging device. Each command is defined by at least one acquisition parameter. The technique includes executing a first, predefined block of commands to acquire first images, and upon positive verification, by image analysis of a stop condition upon executing the first block, stopping the first block to execute a second predefined block of commands to acquire second images, the commands of the second block being defined by at least one second acquisition parameter, dynamically defined depending on the image analysis.