The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jan. 05, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Jose Miguel Serra Lleti, Wetzlar, DE;
Alexander Schmitz, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An arrangement for examining a plurality of samples within a sample region includes optics configured to selectively image the sample region in a transmitted light imaging mode or a fluorescence imaging mode. The arrangement further includes a processing apparatus configured to provide first operating instructions causing the arrangement to be operated in the transmitted light imaging mode, select one or more regions of interest in the sample region based on selection information obtained based on a stack of widefield images generated in the transmitted light imaging mode, provide position information relating to the one or more regions selected in the sample region, and provide second operating instructions causing the arrangement to be operated in the fluorescence imaging mode at fluorescence imaging positions based on the position information.