The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jan. 06, 2022
Applicant:

Shenzhen Microbt Electronics Technology Co., Ltd., Guangdong, CN;

Inventors:

Mo Chen, Guangdong, CN;

Zhijun Fan, Guangdong, CN;

Jianbo Liu, Guangdong, CN;

Chao Xu, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G11C 29/12015 (2013.01);
Abstract

A test circuit (), including: a test sequence providing module (), configured to provide a test sequence (PRBS) to a to-be-tested sequential device (); a clock driving module (), configured to provide a clock signal () to the to-be-tested sequential device (), which includes a first clock driving circuit (), wherein the first clock driving circuit () includes: a plurality of first clock paths () which respectively provide corresponding clock signals (); and a logic unit () which generates, based on at least part of the clock signals () provided by the plurality of first clock paths (), a first clock signal with an adjusted pulse width, for the to-be-tested sequential device (); and a verification module (), configured to verify an output of the to-be-tested sequential device ().


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