The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Dec. 02, 2019
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); B01L 3/00 (2006.01); B01L 7/00 (2006.01); G01N 24/10 (2006.01); G01N 35/10 (2006.01); B04B 11/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); B01L 3/5023 (2013.01); B01L 7/5255 (2013.01); G01N 35/1002 (2013.01); B04B 2011/046 (2013.01); G01N 2035/0441 (2013.01);
Abstract
Provided is an automatic analysis system in which a conveying lineand a plurality of dispensation linesare disposed not to be parallel, and a device layout of analysis modulesdisposed with a specimen rack distribution moduletherebetween is line-symmetric with respect to a straight lineA passing through the rotation center of a standby disc. Accordingly, even when the automatic analysis system has a configuration for providing specimens from a common specimen rack distribution module to a plurality of analysis modules, the conveyance efficiency of a specimen rack is raised and user accessibility is good.