The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jun. 22, 2022
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Keri Kim, Seoul, KR;

Jeongryul Kim, Seoul, KR;

Sang Kyung Kim, Seoul, KR;

Suhun Jung, Seoul, KR;

Yonghwan Moon, Seoul, KR;

Buchun Song, Seoul, KR;

Hong Jun Cho, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 10/00 (2006.01); A61B 5/08 (2006.01); A61B 10/02 (2006.01); A61B 34/30 (2016.01); A61B 34/37 (2016.01); A61G 10/00 (2006.01); A61L 2/10 (2006.01); B25J 9/06 (2006.01); B25J 15/00 (2006.01); B25J 15/02 (2006.01); B25J 19/02 (2006.01); G01N 1/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0099 (2013.01); G01N 1/02 (2013.01); G01N 2001/028 (2013.01);
Abstract

A specimen collection robot system for performing a specimen collection process having performing specimen collection of a subject with a swab and inserting the swab into a reagent tube has a robot including a gripper and a robot arm. The gripper is configured to grip objects with different diameters by using a same gripping portion. The robot is configured to perform the specimen collection process, by selectively gripping the swab and the reagent tube, without replacing the gripper.


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