The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Oct. 02, 2019
Applicant:

Shimadzu Corporation;

Inventor:

Shinji Kanazawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8634 (2013.01); G01N 30/8637 (2013.01); G01N 30/8641 (2013.01);
Abstract

A waveform analytical devicewhich analyzes a target waveform which is a chromatogram or an optical spectrum includes a waveform division unitconfigured to divide the target waveform into a plurality of partial waveforms, a determination unitconfigured to determine whether each of the plurality of partial waveforms of the target waveform is a peak portion using a learned model created by machine learning using a plurality of sets of a plurality of partial waveforms created by dividing a reference waveform having a peak portion whose position is known, and a classification unitconfigured to classify the target waveform into a peak region where the peak portion continues and a non-peak region other than the peak region based on a determination result from the determination unit.


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