The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Nov. 23, 2022
Applicant:

Tohoku University, Sendai, JP;

Inventors:

Shin Yabukami, Sendai, JP;

Kazuhiko Okita, Sendai, JP;

Assignee:

TOHOKU UNIVERSITY, Sendai, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/72 (2013.01); G01R 33/1223 (2013.01);
Abstract

The measurement device for measuring permeability and permittivity of an object, includes a probe in which a signal transmission line is formed and on which the object is capable of being disposed close to or in contact with the signal transmission line; a magnetic-field application unit configured to apply a magnetic-field to the object; a signal measurement instrument configured to measure a signal transmitted through the signal transmission line in each state in which the object is disposed and not disposed on the signal transmission line and in each state in which the magnetic-field is applied and not applied; a permeability processing unit configured to obtain the permeability of the object; and a permittivity processing unit configured to obtain the permittivity of the object, the both units obtaining based on the signal transmitted through the signal transmission line in each state in which the magnetic-field is applied and not applied.


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