The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Apr. 08, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Yufuku Matsushita, Tokyo, JP;
Atsushi Kishioka, Tokyo, JP;
Haruyoshi Yamamoto, Tokyo, JP;
Masafumi Miyake, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
An analysis device measures ion concentration in a sample to detect an abnormality using an ion selective electrode. The analysis device includes an ion selective electrode that obtains a potential based on the ion concentration, a reference electrode that obtains a potential based on a reference liquid, a measurement unit that measures an electromotive force between the ion selective electrode and the reference electrode, an analyzer that analyzes a potential change of the electromotive force in a certain time region, and a storage that stores abnormality analysis data indicating a relation between the potential change and an abnormality of the analysis device. The analyzer acquires a parameter for the potential change of the electromotive force measured by the measurement unit, and analyzes the abnormality of the analysis device based on the parameter and the abnormality analysis data stored in the storage.