The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Aug. 17, 2021
Applicant:

Sikora Ag, Bremen, DE;

Inventors:

Harald Sikora, Bremen, DE;

Armin Holle, Achim, DE;

Assignee:

SIKORA AG, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); G01N 21/3581 (2013.01); G01N 2201/0221 (2013.01);
Abstract

A method for determining a refractive index in a surface region of an object from a production system which has not cooled to an ambient temperature includes emitting terahertz radiation from a transmitter at an angle of incidence to the surface region of the object. The terahertz radiation is reflected from the surface region of the object and received by a receiver. The refractive index of the surface region of the object from a ratio of the emitted and reflected terahertz radiation is determined using an evaluator in communication with the transmitter and the receiver. The influence of surface properties of the object on a portion of the reflected terahertz radiation is taken into account when determining the refractive index.


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